happylifekennel.comhappybook
Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density
Read Online
Share

Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density by Russell, T. J.

  • 239 Want to read
  • ·
  • 72 Currently reading

Published by U.S. Dept. of Commerce, National Bureau of Standards, National Technical Information Service, distributor in Washington, DC, [Springfield, VA .
Written in English

Subjects:

  • Microelectronics.,
  • Oxides -- Thermal properties.,
  • Electric charge and distribution.

Book details:

Edition Notes

StatementT.J. Russell ; prepared for Air Force Wright Aeronautical Laboratories and Naval Air Systems Command.
SeriesNBSIR -- 81-2413., NBSIR -- 2413.
ContributionsAir Force Wright Aeronautical Laboratories., United States. Naval Air Systems Command., United States. National Bureau of Standards.
The Physical Object
Paginationiv, 36 p. :
Number of Pages36
ID Numbers
Open LibraryOL17656048M

Download Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density

PDF EPUB FB2 MOBI RTF